表彰名：平成９年度日本光学会研究奨励賞、受賞論文： M. Abe et. al. : “Measurement of the Evanescent Field Using Noncontact Mode Atomic Force Microscope”, Optical Review Vol.4, No.1B (1997)
232、受賞日：平成９年９月３０日、授与：日本光学会
M. Abe: Compendium of Surface and Interface Analysis (Eds. The Surface Science Society of Japan), Chapter 34 " Frequency Modulation Atomic Force Microscopy", pp.201-204, Springer, ISBN-10:
9811061556, ISBN-13: 978-9811061554 (2018).
Y. Sugimoto, M. Abe, and S. Morita: Imaging and Manipulation of Adsorbates Using Dynamic Force Microscopy, Advances in Atom and Single Molecule Machines (Eds. P. Moriarty and S. Gauthier),
Chapter 3 “Atom Manipulation using atomic force microscopy at room temperature”, pp. 49-62, Springer, ISBN-10: 3319174002, ISBN-13: 978-3319174006 (2015).
Masayuki. Abe, Yoshiaki Sugimoto and Seizo Morita, Noncontact Atomic Force Microscopy vol.3 (Eds. S. Morita, F.J. Giessibl, E, Meyer and R. Wiesendanger) , Chap.4 “Manipulation and
Spectroscopy Using AFM/STM at Room Temperature”, Springer ISBN-10: 3319155873, ISBN-13: 978-3319155876 (2015).
M. Abe and K. Morita, Noncontact Atomic Force Microscopy vol.2 (Eds. S. Morita, F.J. Giessibl, and R. Wiesendanger) , Chap.2 “Precise force measurement”, Springer (2009).
S. Morita, T. Uchihashi, K. Okamoto, M. Abe and Y. Sugawara : “Microscale contact charging on a silicon oxide”, ASINATO Scanning Probe Microscopy: Characterization, Nanofabrication and Device
Application of Functional Materials Edited by Paula Maria Vilarinho, NATO Science Series, II. Mathematics, Physics and Chemistry, 2003.
特許
国内特許
特許番号：10,928,433, 出願番号：15/758175,International Application Number: PCT/JP2016/067767, 発明者：Masayuki Abe and Hiroshi Toki, , 発明の名称：「METHOD AND PROGRAM FOR CALCULATING POTENTIAL, CURRENT, AND
PERIPHERAL ELECTROMAGNETIC FIELD IN ELECTRIC CIRCUIT」, 出願人：OSAKA UNIVERSITY, 原出願：JP2015-195118, 出願日：2016/6/15.
出願番号：16/476426, International Application Number:PCT/JP2017/044060, 発明者：Hyamato Yamashita and Masayuki Abe, 発明の名称：「SCANNER AND SCANNING PROBE MICROSCOPE」, 出願人：OSAKA UNIVERSITY, ,
原出願：特願2017-002183出願日：2019/7/8.
出願番号：11802624, 発明者：Masayuki Abe, Masahiro Ohta, Yoshiaki Sugimoto, Kenichi Morita, Noriaki Oyabu, Morita Seizo, Oscar Custance 発明の名称：「Probe position control system and method」, 出願人：SHIMADZU
CORPORATION and OSAKA UNIVERSITY, 出願日：2007/5/24.
出願番号：10228189, 発明者：Masayuki Abe, 発明の名称：「磁気ヘッド検査装置及び磁気ヘッド検査方法」（“Method and apparatus for measuring magnetic head”）, 出願人：Toshiba Corporation, 出願日：2002/8/27.
出願番号：10062571, 発明者：Masayuki Abe, 発明の名称：「磁気ヘッド測定装置及び同装置に適用する測定方法」（“Magnetic head measuring apparatus and measuring method applied to the same apparatus”）, 出願人：Toshiba Corporation, 出願日：2002/2/5
出願番号：09835547, 発明者：Masayuki Abe, 発明の名称：「磁気抵抗効果素子の特定測定装置及び方法、磁気再生ヘッドの特性測定装置及び方法」（“Device and method for measuring the properties of a magnetic reproducing head”）, 出願人：Toshiba Corporation,
出願日：2001/4/17
出願番号：09811771, 発明者：Masayuki Abe, 発明の名称：「磁気記録ヘッド測定装置及び同装置に適用する測定方法」（“Method and apparatus for measuring characteristic of specimen and its application to high frequency response measurement
with scanning probe microscopes”）, 出願人：Toshiba Corporation, 出願日：2001/3/20
出願番号：09800744, 発明者：Masayuki Abe, 発明の名称：「磁界特性評価装置及び測定方法」（“Magnetic field characteristics evaluation apparatus and magnetic field characteristics measuring method”）, 出願人：Toshiba Corporation,
出願日：2001/3/8
上記以外の国およびPCT出願
出願国： EU, 出願番号：17891868.6,International Application Number: PCT/JP2017/044060, 発明者：Hyamato Yamashita and Masayuki Abe, 発明の名称：「SCANNER AND SCANNING PROBE MICROSCOPE」, 出願人：OSAKA UNIVERSITY,
原出願：特願2017-002183, 出願日：2019/8/2.
出願国：中国，出願番号：2019072400860340, International Application Number: PCT/JP2017/044060, 発明者：Hyamato Yamashita and Masayuki Abe, 発明の名称：「SCANNER AND SCANNING PROBE MICROSCOPE」, 出願人：OSAKA UNIVERSITY,
原出願：特願2017-002183, 出願日：2019/7/29.
出願国：中国, 出願番号：200710138848, 発明者：Masayuki Abe, Masahiro Ohta, Yoshiaki Sugimoto, Kenichi Morita, Noriaki Oyabu, Oscar Custance, Seizo Morita, 発明の名称：Probe position control system and method,
出願人：Shimazu Corporation and Osaka University, 出願日：2007/5/24
M. Abe: "Imaging Contrast of Anatase TiO2(001) with Non-Contact Atomic Force Microscopy", The 3rd International Symposium on "Recent Trend in the Elucidation and Function Discovery of Next
Generation Function Materials of Surface/Interface Properties", 18th June 2018, Osaka University, Japan.
M. Abe: “Non-contact Atomic Force Microscopy for Nano-characterization”, 12th International Ceramics Congress, 2010/6/8, Montecatini Terme, Italy.
M. Abe: “Room-temperature AFM experience with large amplitude”, Omicron Nanotechnology International Workshop on “Simultaneous STM/AFM measurements using tuning fork based sensors”,
2009/10/14,15, Institute of Physics of the Czech Academy of Science, Czech Republic.
阿部真之: “LabVIEWで原子を見て動かす”, LabVIEW Days 2007, 2007/11/22, ザ・プリンスパークタワー東京.
M. Abe: “Interchange atom manipulation toward the fabrication of solid quantum devices”, Handai Nanoscience and Nanotechnology International Symposium 2006, Nov. 20-22, Osaka University
Nakanoshima Center, Japan (O-4-3).
M. Abe : “磁気力顕微鏡のヘッド開発への応用”,インターナショナルディスクフォーラム２００２, April 10-12 (2002), Tokyo Big Site, Tokyo, Japan.
M. Abe and Y. Tanaka : “A study of high frequency characteristics of write head with the magnetic force microscope”, The magnetic recording conference 2001, August 20-22 (2001), Minneapolis,
MN, USA.
M. Abe, Y. Sugawara, and S. Morita : “Detection of evanescent field by using noncontact mode atomic force microscope”, The 4th International Colloquium on Scanning Tunneling Microscopy,
December 12-14 (1996), Kanazawa Institute of Technology, Kanazawa, Japan.
