査読付き論文

  1. Z. Diao, D. Katsube, H. Yamashita, Y. Sugimoto, O. Custance, and M. Abe: "Automated extraction of the short-range part of the interaction in non-contact atomic force microscopy", Appl. Phys. Lett. Vol.117, p.033104 (2020), doi: 10.1063/5.0007754
  2. S. Jinno, S. Kitora, H. Toki, and M. Abe: "Time-Domain Ringing Noise Analysis Induced in Transmission Lines using the Common and Normal Mode Concepts", International Journal of Circuit Theory and Applications, Hhttp://dx.doi.org/10.1002/cta.2841
  3. H. Yamashita, N. Handa, Y. Higashiura, and M. Abe: “Flexure structural scanner of tip scan type for high-speed scanning tunneling microscopy”, e-Journal of Surface Science and Nanotechnology Vol.18, pp146-151 (2020), https://doi.org/10.1380/ejssnt.2020.146.
  4. S. Jinno, S. Kitora, H. Toki, and M. Abe: "Origin of common-mode noise in two-dimensional finite-size circuit and reduction of the noise using a symmetric three-line circuit", International Journal of Circuit Theory and Applications, https://doi.org/10.1002/cta.2788.
  5. Daiki Katsube, Shoki Ojima, Eiichi Inami, Masayuki Abe, “Atomic-resolution imaging of rutile TiO2(110)-(1 × 2) reconstructed surface by non-contact atomic force microscopy”, Beilstein J. Nanotechnol. 11, pp.443-449 (2020).
  6. S. Jinno, S. Kitora, H. Toki, and M. Abe: “Time-domain Formulation of a Multi-layer Plane Circuit Coupled with Lumped-parameter Circuits using Maxwell Equations”, Sci. Rep. Vol.9, 17891 (2019), https://www.nature.com/articles/s41598-019-53288-x
  7. S. Jinno, S. Kitora, H. Toki, and M. Abe: “Mechanism of Common-mode Noise Generation in Multi-conductor Transmission Lines”, Sci. Rep. Vol.9, 15036 (2019), https://www.nature.com/articles/s41598-019-51259-w. M. Hashimoto, S. Kitaoka, M. Furuya, H. Kanetaka, K. Hoshikaya, H. Yamashita, and M. Abe: “Enhancement of cell differentiation on surface potential-controlled nitrogen-doped TiO2 scale”, J. Ceramic Soc. Jpn. Vol.127, pp.636-641 (2019), https://doi.org/10.2109/jcersj2.19114.
  8. S. Ojima, D. Katsube, H. Yamashita, Y. Miyato, S. Abo, and M. Abe, “Surface structure switching between (1x1) and (1x 2) of rutile TiO2(110) with scanning tunneling microscopy and low energy electron diffraction”, Jpn. J. Appl. Phys. Vol.58, SIIA10 (2019), https://doi.org/10.7567/1347-4065/ab19a3.
  9. Y. Miyato, K. Otani, K. Nagashima, and M. Abe: “Ice surface formed in vapor phase at near freezing-point investigated by AFM” , Jpn. J. Appl. Phys. Vol.58, SIIA09 (2019), https://doi.org/10.7567/1347-4065/ab203d. 
  10. D. Katsube and M. Abe: “"Dual contrast mode" imaging of anatase TiO2(001)-(1x4) reconstructed surface using non-contact atomic force microscopy”, Jpn. J. Appl. Phys. Vol.58, SIIA11 (2019), https://doi.org/10.7567/1347-4065/ab1071.
  11. D. Katsube and M. Abe: “Imaging patterns of anatase TiO2(001) with non-contact atomic force microscopy”, Nanotechnology Vol. 30,  215704 (2019), https://doi.org/10.1088/1361-6528/ab02a7.
  12. M. Abe and H. Toki: “Theoretical Study of Lumped Parameter Circuits and Multiconductor Transmission Lines for Time-Domain Analysis of Electromagnetic Noise”, Sci. Rep. Vol.9, Article number 118 (2019), DOI:10.1038/s41598-018-36383-3.
  13. D. Katsube and M. Abe: "High-resolution imaging of LaAlO3 (100)-(1x4) reconstructed surface using non-contact atomic force microscopy", Appl. Phys. Lett. Vol.113, p.031601 (2018), https://doi.org/10.1063/1.5037741.
  14. H. Kashida, Y. Hattori, K. Tazoe, T. Inoue, K. Nishikawa, K. Ishii, S. Uchiyama, , H. Yamashita, M. Abe, Y. Kamiya, H. Asanuma: "Bifacial nucleobases for hexaplex formation in aqueous solution", J. Am. Chem. Soc. Vol.4, pp.8456-8462 (2018), DOI: 10.1021/jacs.8b02807.
  15. E. K. Fodjo, A. Canlier, C. Kong, A. Yurtsever, P. L. A. Guillaume, F. T. Patrice, M. Abe, T. Tohei, A. Sakai: "Facile Synthesis Route of Au-Ag Nanostructures Soaked in PEG", Advances in Nanoparticles Vol. 7, pp.37-45 (2018).
  16. Masami Hashimoto, Takafumi Ogawa, Satoshi Kitaoka, Shunsuke Muto, Maiko Furuya, Hiroyasu Kanetaka, Masayuki Abe, Hayato Yamashita: "Control of surface potential and hydroxyapatite formation on TiO2 scales containing nitrogen-related defects", Acta Materialia Vol.155, pp.379-385 (2018)。
  17. D. Katsube, H. Yamashita, S. Abo, and M. Abe: "Combined pulsed laser deposition and non-contact atomic force microscopy system for studies of insulator metal oxide thin films", Beilstein J. Nanotechnol. Vol.9, pp.686–692 (2018), doi:10.3762/bjnano.9.63.
  18. A. Yurtsever, M. Abe, S. Morita, and Y. Sugimoto: "An atom manipulation method to substitute individual adsorbate atoms into Si(111)-(7x7) substrate at room temperature", Appl. Phys. Lett. Vol.111, 233102 (2017).
  19. S. Jinno, H. Toki, and M. Abe: “Mechanism of common-mode noise and heat generation in an electric circuit with grounding using multiconductor transmission-line theory”, Chinese Journal of Physics (2017) https://doi.org/10.1016/j.cjph.2017.03.002.
  20. Ayhan Yurtsever, Delia Fernández-Torre, Jo Onoda, Masayuki Abe, Seizo Morita, Yoshiaki Sugimoto and Ruben Perez: “Local electronic properties of individual Pt atoms adsorbed on TiO2(110) studied with Kelvin probe force microscopy and first-principles simulations”, Nanoscale Vol.9, pp.5812–5821 (2017).
  21. Ayhan Yurtsever, Jo Onoda, Takushi Iimori, Kohei Niki, Toshio Miyamachi, Masayuki Abe, Seigi Mizuno, Satoru Tanaka, Fumio Komori, Yoshiaki Sugimoto: “Effects of Pb Intercalation on the Structural and Electronic Properties of Epitaxial Graphene on SiC”, Small Vol.12, pp.3956-3966 (2016) DOI: 10.1002/smll.201600666
  22. S. Jinno, H. Toki, and M. Abe: “Configuration of Three Distributed Lines for Reducing Noise Due to the Coupling of the Common and Normal Modes”, Nuclear Instrumentation and Methods in Physics Research A Vol. 844, pp. 19–23 (2017), http://dx.doi.org/10.1016/j.nima.2016.11.017.
  23. Ayhan Yurtsever, Jo Onoda, Takushi Iimori, Kohei Niki, Toshio Miyamachi, Masayuki Abe, Seigi Mizuno, Satoru Tanaka, Fumio Komori, Yoshiaki Sugimoto: “Effects of Pb Intercalation on the Structural and Electronic Properties of Epitaxial Graphene on SiC”, Small Vol.12, pp.3956-3966 (2016)Ayhan Yurtsever, Jo Onoda, Masayuki Abe, Chi Lun Pang, Yoshiaki Sugimoto: “Imaging the TiO2 (011)-(2×1) Surface using Noncontact Atomic Force Microscopy and Scanning Tunneling Microscopy”, The Journal of Physical Chemistry C Vol.120, pp 3390–3395 (2016).
  24. Shuhei Okawaki, Satoshi Abo, Fujio Wakaya, Hayato Yamashita, Masayuki Abe, Mikio Takai: “Characterization of X-ray charge neutralizer using carbon-nanotube field emitter”, Japanese Journal of Applied Physics Vol.55, 06GF10 (2016).Hiroshi Toki and Masayuki Abe : “Multiconductor transmission-line theory that includes an antenna process with a lumped-parameter circuit” Journal of the Physical Society of Japan Vol.85, pp.034801-1/-8 (2016).
  25. Daiki Katsube, Yutaro Takase, Hayato Yamashita, Satoshi Abo, Fujio Wakaya, and Masayuki Abe: “A Preparation Method for Atomically Clean Sapphire Surfaces and High Resolution Topographic Method for Their Imaging by Non-contact Atomic Force Microscopy”, Material Transactions Vol.56, No.8 pp.1310-1313 (2015).
  26. Shuhei Okawaki, Satoshi Abo, Fujio Wakaya, Masayuki Abe, and Mikio Takai: “X-ray source using carbon-nanotube field emitter with side-gate electrode”, Japanese Journal of Applied Physics Vol.54, pp.06FF10-1/-4 (2015).
  27. Fujio Wakaya, Tadashi Kurihara, Nariaki Yurugi, Satoshi Abo, Masayuki Abe, and Mikio Takai: “Maskless Laser Processing of graphene”, Microelectronic Engineering Vol.141, pp203-206 (2015).
  28. Delia Fernández-Torre, Ayhan Yurtsever, Jo Onoda, Masayuki Abe, Seizo Morita, Yoshiaki Sugimoto, and Rubén Pérez: “Pt atoms adsorbed on TiO2(110)-(1×1) studied with non-contact atomic force microscopy and first-principles simulations”, Physical Review B Vol.91, 075401 (2015).
  29. Eiichi Inami, Ikutaro Hamada, Keiichi Ueda, Masayuki Abe, Seizo Morita, Yoshiaki Sugimoto: “Room-temperature concerted switch of a binary atom cluster”, Nature Communications, doi:10.1038/ncomms7231
  30. Shuji Kitora, Masayuki Abe, and Hiroshi Toki : “Electromagnetic Noise in Electric Circuits: Ringing and Resonance Phenomena in the Common Mode”, AIP advances Vol.4, 117119-1/-6 (2014).
  31. Stefan Kuhn, Markus Kittelmann, Yoshiaki Sugimoto, Masayuki Abe, Angelika Kühnle, and Philipp Rahe : “Identifying the absolute orientation of a low-symmetry surface in real space”, Physical Review B vol.90, pp.195405-1/-12 (2014).
  32. Kohei Yamasue, Masayuki Abe, Yoshiaki Sugimoto, and Yasuo Cho: “Atomic-dipole-moment induced local surface potential on Si(111)-(7x7) surface studied by non-contact scanning nonlinear dielectric microscopy” Applied Physics Letters, vol. 105, 121601-1/-3 (2014), http://dx.doi.org/10.1063/1.4896323
  33. Masataka Suzuki, Kohei Yamasue, Masayuki Abe, Yoshiaki Sugimoto, and Yasuo Cho: “Atomic-resolution study of electric dipoles on a Si(100)-2×1 surface by non-contact scanning nonlinear dielectric microscopy”, Applied Physics Letters, vol.105, pp.101603-1/-3 (2014).
  34. Yoshiaki Sugimoto, Ayhan Yurtsever, Naoki Hirayama, Masayuki Abe, and Seizo Morita: “Mechanical gate control for atom-by-atom cluster assembly with scanning probe microscopy”, Nature Communications, DOI: 10.1038/ncomms5360, (2014).
  35. Y. Sugimoto, M. Ondráček, M. Abe, P. Pou, S. Morita, Ruben Pérez, F. Flores, P. Jelinek: “Quantum degeneracy in atomic point contacts revealed by chemical force and conductance”, Physical Review Letters, vol.111, pp.106803-1/-5 (2013).
  36. Y. Sugimoto, A. Yurtsever, M. Abe, S. Morita, M. Ondráček, P. Pou, R. Pérez, and P. Jelínek: “Role of tip chemical reactivity on atom manipulation process in dynamic force microscopy”, ACS Nano, vol.7, pp.7370-7376 (2013).
  37. A. Yurtsever, Y. Sugimoto, H. Tanaka, M. Abe, S. Morita, M. Ondráček, P. Pou, R. Pérez, and P. Jelínek: “Force mapping on hydrogen terminated Si(111)-(7x7) surface”, Physical Review B Vol. 87, 155403-1/-10 (2013).
  38. A. Sweetman, A. Stannard, Y. Sugimoto, M. Abe, S. Morita, and P. Moriarty: “Simultaneous noncontact AFM and STM of Ag:Si(111)-(√3x√3)R30°”, Physical Review B Vol.87, 075310-1/-8 (2013).
  39. A. Yurtsever, Y. Sugimoto, M. Fukumoto, M. Abe, and S. Morita: “Effect of tip polarity on Kelvin probe force microscopy images of thin insulator CaF2 films on Si(111)”, Applied Physics Letters Vol.101, 083119-1/-3 (2012).
  40. A. Yurtsever, D. Fernández-Torre, C. González, P. Jelínek, P. Pou, Y. Sugimoto, M. Abe, Rubén Pérez, S. Morita: “Understanding image contrast formation in TiO2 with force spectroscopy”, Physical Review B Vol.85, 125416-1/-9 (2012).
  41. Y. Sugimoto, K. Ueda, M. Abe, and S. Morita: “Three dimensional scanning force/tunneling spectroscopy at room temperature”, Journal of Physics: Condensed Matter Vol.24, pp.084008-1/-7 (2012).
  42. H. J. Chung, A. Yurtsever, Y. Sugimoto, M. Abe, and S. Morita:  “Kelvin probe force microscopy characterization of TiO2(110)-supported Au clusters”, Applied Physics Letters Vol.99, pp.123102-1/-3 (2011).
  43. A. Yurtsever, Y. Sugimoto, M. Abe, K. Matsunaga, I. Tanaka, and S. Morita: “Alkali-metal adsorption and manipulation on hydroxylated TiO2(110) surface using atomic force microscopy”, Physical Review B Vol.84, pp.085413-1/-7 (2011).
  44. K. Morita, Y. Sugimoto, M. Abe, and S. Morita: “Simultaneous scanning force/tunneling microscopy using a quartz cantilever with a tungsten tip”, Applied Physics Express Vol.4, pp.115201-1/-3 (2011) .
  45. Philipp Rahe,  Jens Schütte, Werner Schniederberend, Michael Reichling, Masayuki Abe, Yoshiaki Sugimoto, and Angelika Kühnle: “Flexible drift-compensation system for precise 3D force mapping in severe drift environments”, Review of Scientific Instruments Vol. 82, p. 063704-1/-7 (2011).
  46. Ken-ichi Morita, Yuuki Sasagawa, Yuusuke Murai, Yoshiaki Sugimoto, Masayuki Abe, and Seizo Morita: “Fabrication of quartz cantilevers for small amplitude dynamic force microscopy using an optical deflection sensor”, Japanese Journal of Applied Physics Vol.50, pp.08LB12-1/-4 (2011).
  47. Insook Yi, Ryuji Nishi, Masayuki Abe, Yoshiaki Sugimoto, and Seizo Morita: “Lateral Manipulation of Single Defect on Insulating Surface Using Noncontact Atomic Force Microscope”, Japanese Journal of Applied Physics Vol. 50, pp.015201-1/-4 (2011).
  48.  K. Morita, Y. Sugimoto, M. Abe, and S. Morita: “Small-amplitude dynamic force microscopy using a quartz cantilever with an optical interferometer”, Nanotechnology Vol.21 p.305704-1/-4 (2010).
  49. Y. Sugimoto, Y. Nakajima, D. Sawada, M. Abe, and S. Morita: “Simultaneous AFM and STM measurements on the Si(111)-(7x7) surface”, Physical Review B Vol.81, pp.245322-1/-9 (2010).
  50. Y. Sugimoto, I. Yi, M. Abe, and S. Morita:  “Simultaneous force and current mapping of the Si(111)-(7x7) surface by dynamic force microscopy”, Applied Physics Letters Vol. 96 pp. 263114-1/-3 (2010).
  51. A. Yurtsever, Y. Sugimoto, M. Abe, and S. Morita: “NC-AFM imaging of the TiO2 (110)-(1x1) surface at low temperature”, Nanotechnology Vol.21, p.165702-1/-7 (2010).
  52. Daisuke Sawada, Yoshiaki Sugimoto, Masayuki Abe, and Seizo Morita: “Observation of Subsurface Atoms of the Si(111)-(7x7) Surface by Atomic Force Microscopy”, Applied Physics Express Vol.3, pp.116602-1/-3 (2010).
  53. K. Nagashima, M. Abe, S. Morita, N. Oyabu, K. Kobayashi, H. Yamada, M. Ohta, R. Kokawa, R. Murai, H. Matsumura, H. Adachi, K. Takano, S. Murakami, T. Inoue, and Y. Mori: “Molecular resolution investigation of tetragonal lysozyme (110) face in liquid by FM-AFM”, Journal of Vacuum and Science Technology B Vol.28, C4C11-C4C14 (2010).
  54. D. Sawada, Y. Sugimoto, K. Morita, M. Abe, and S. Morita: “Simultaneous atomic force and scanning tunneling microscopy study of the Ge(111)-c(2x8) surface”, Journal of Vacuum and Science Technology B Vol.28, C4D1-C4D4 (2010).
  55. S. Sadewasser, P. Jelinek, C.-K. Fang, O. Custance, Y. Yamada, Y. Sugimoto, M. Abe, and S. Morita: “New insights on atomic-resolution Frequency-Modulation Kelvin Probe Force Microscopy imaging on semiconductors”,  Physical Review Letters Vol.103, pp.266103-1/266103-4 (2009).
  56. D. Sawada, Y. Sugimoto, K. Morita, M. Abe and S. Morita: “Simultaneous measurement of force and tunneling current at room temperature”, Applied Physics Letters Vol.94, pp.173117-1/173117-3 (2009).
  57. Y. Sugimoto, T. Namikawa, M. Abe, and S. Morita: “Mapping and imaging for rapid atom discrimination: A study of frequency modulation atomic force microscopy”, Applied Physics Letters vol.94, pp.023108-1/023108-3 (2009).
  58. D. Sawada, A. Hirai, Y. Sugimoto, M. Abe, and S. Morita: “Simultaneous Atomic Imaging of Atomic Force Microscopy and Scanning Tunneling Microscopy Using Metal Coated Cantilevers”, Materials Transactions, Vol.50, pp.940-942 (2009).
  59. Y. Sugimoto, K. Miki, M. Abe, and S. Morita: “Statistics of lateral atom manipulation by atomic force microscopy at room temperature”, Physical Review B vol.78, pp.205305-1/-5 (2008).
  60. Y. Sugimoto,  P. Pou, O. Custance, P. Jelinek, M. Abe, R. Perez, S. Morita: “Complex Patterning by Vertical Interchange Atom Manipulation Using Atomic Force Microscopy”, Science vol,322, pp.413-417 (2008).
  61. Y. Sugimoto, T. Namikawa, K. Miki, M. Abe, and S. Morita: “Vertical and lateral force mapping on the Si(111)-(7x7) surface by dynamic force microscopy”, Physical Review B vol.77, pp.195424-1/-9 (2008).
  62. T. Matsukawa, Y. Takahashi, T. Tokiyama, K. Sasai, Y. Murai, N. Hirota, Y. Tominari, N. Mino, M. Yoshimura, M. Abe, J. Takeya, Y. Kitaoka, Y. Mori, S. Morita, and T. Sasaki: “Solution Growth of Rubrene Single Crystals Using Various Organic Solvents”, Japanese Journal of Applied Physics vol.47, No.12, pp.8950-8954 (2008).
  63. D. Sawada, T. Namikawa, M. Hiragaki, Y. Sugimoto, M. Abe, and S.Morita : “High Spatial Resolution Topographic Imaging and Dimer Distance Analysis of Si(100)-(2×1) Using Non-contact Atomic Force Microscopy”, Japanese Journal of Applied Physics vol.47, No.7, pp.6085-6087 (2008).
  64. V. Kittichungchit, T. Shibata, H. Noda, H. Tanaka, A. Fujii, N. Oyabu, M. Abe, S. Morita, and M. Ozaki : “Efficiency enhancement in organic photovoltanic cell with interpenetrating conducting polymer/C60 heterojunction structure by sabstrate-heating treatment”, Japanese Journal of Applied Physics vol47, No.2, pp.1094-1097 (2008).
  65. A. Ohiso, M. Hiragaki, K. Mizuta, Y. Sugimoto, M. Abe and S. Morita : “Atom-by-Atom Chemical Coordination Effect Observed in Noncontact AFM Topography of Pb/Si(111)-(√3x√3) Mosaic Phase”, e-Journal of Surface Science and Nanotechnology vol.6, pp.79-83 (2008).
  66. Y. Sugimoto, S. Innami, M. Abe, O. Custance, and S. Morita: “Dynamic force spectroscopy using cantilever higher flexural modes”, Applied Physics Letters vol.91, pp.093120-1/-3 (2007).
  67. M. Abe, Y. Sugimoto, T. Namikawa, K. Morita, N. Oyabu, and S. Morita: “Drift-compensated data acquisition performed at room temperature with frequency modulation atomic force microscopy”, Applied Physics Letters vol.90, No.20, pp.203103-1/-3 (2007).
  68. Y. Sugimoto, P. Pou, M. Abe, P. Jelinek, R. Pérez, S. Morita, O. Custance “Chemical identification of individual surface atoms by atomic force microscopy”, Nature Vol. 446, pp. 64 - 67 (Mar 2007).
  69. Y. Sugimoto, M. Abe, S. Konoshita, and S. Morita: “Direct observation of vacancy site of the iron silicide c(4x8) phase using frequency modulation atomic force microscopy”, Nanotechnology Vol.18, No2, pp.84012-1/-4 (2007).
  70. Y. Sugimoto, P. Jelinek, P. Pou, M. Abe, S. Morita, R. Perez, and O. Custance: “Mechanism for Room-Temperature Single-Atom Lateral Manipulations on Semiconductors using Dynamic Force Microscopy”, Physical Review Letters vol.98, p.106104-1/-4 (2007).
  71. I. Yi, Y. Sugimoto, R. Nishi, M. Abe, S. Morita: “Atomic structure of Ge clusters on Si(111)-(7×7) by non-contact AFM”, Nanotechnology Vol.18, No.2, pp84013-1/-4 (2007).
  72. Y. Seino, S. Yoshikawa, M. Abe, and S. Morita: “Growth dynamics of insulating SrF2 films on Si(111)” , Journal of Physics: Condense Matter vol.19, pp.445001-1/-9 (2007).
  73. A. Ohiso, Y. Sugimoto, M. Abe, and S. Morita: “Tip-Induced Local Reconstruction on the Pb/Ge(111) Surface Using Frequency Modulation Atomic Force Microscopy”, Japanese Journal of Applied Physics vol.46, No.8B. pp. 5582-5585 (2007).
  74. A. Ohiso, Y. Sugimoto, K. Mizuta, M. Abe, and S.Morita: “Non-contact atomic force microscopy investigation of the (1x1) and (√3x√3) phases on the Pb/Si(111) surface”, e-Journal of Surface Science and Nanotechnology vol.5, pp.67-73 (February 2007).
  75. S. Morita, Y. Sugimoto, and M. Abe: “Toward atom-by-atom assembly of compound semiconductor nanostructures: mechanical atomic discrimination and atomic manipulation at room temperature”, Current Nanoscience Vol.3, No.1, pp.31-40 (2007).
  76. Y. Sugimoto, M. Abe, S. Hirayama, and S. Morita: “Highly resolved non-contact atomic force microscopy images of the Sn/Si(111)-(2√3x2√3) surface”, Nanotechnology Vol.17, No.16, pp.4235-4239 (2006).
  77. N. Oyabu, P. Pou, Y. Sugimoto, P. Jelinek, M. Abe, S. Morita, R. Pérez, and O. Custance : “Single atomic contact adhesion and dissipation in dynamic force microscopy”, Physical Review Letters vol.96, pp.106101-1/-4 (May 2006).
  78. Yoshiaki Sugimoto, Pablo Pou, Óscar Custance, Pavel Jelinek, Seizo Morita, Rubén Pérez, and Masayuki Abe: “Real topography, atomic relaxations, and short-range chemical interactions in atomic force microscopy: The case of the a-Sn/Si(111)-(√3x√3)R30° surface”, Physical Review B Vol.73, No.20, pp.205329-1/-9 (2006). 
  79. I. Yi, R. Nishi, Y. Sugimoto, M. Abe, Y. Sugawara, and S. Morita: “Discrimination of individual atoms on Ge/Si(111)-(7x7) intermixed surface”, Surface Science Vol.600, No.13, pp.2766-2700 (2006).
  80. Y. Sugimoto, O. Custance, M. Abe, and S. Morita : “Site-specific force spectrosocpy and atom interchange manipulation at room temperature”, e-Journal of Surface Science and Nanotechnology Vol.4, pp.376-383 (2006).
  81. N. Oyabu, O. Custance, M. Abe, and S. Morita : “Mechanical atom manipulation and nanostructuring at low temperature”, e-Journal of Surface Science and Nanotechnology Vol.4, pp.1-8 (2006).
  82. M. Abe, Y. Sugimoto, O. Custance, S. Morita : “Atom-tracking for reproducible force spectroscopy at room temperature with non-contact atomic force microscopy”, Nanotechnology Vol.16, No.12, pp.3029-3034 (December 2005).
  83. M. Abe, Y. Sugimoto, O. Custance, S. Morita : “Room-temperature spatial force spectroscopy using atom-tracking technique”, Applied Physics Letters Vol.87, No. 17, pp. 173503-1/-3 (2005).
  84. Y.Sugimoto, M. Abe, S. Hirayama, N. Oyabu, O. Custance, and S. Morita : “Atom inlays performed at room temperature using atomic force microscopy”, Nature Materials Vol.4, pp.156-159 (Feb 2005).
  85. M.Abe, Y. Sugimoto, and S. Morita : “Imaging the restatom of the Ge(111)-c(2x8) surface with noncontact atomic force microscopy at room temperature”,  Nanotechnology Vol.16, No. 3, pp.S68-S72 (Mar. 2005).
  86. N. Oyabu, Y. Sugimoto, M. Abe, O. Custance, S. Morita: “Lateral manipulation of single atoms at semiconductor surfaces using atomic force microscopy”, Nanotechnology, Vol.16, No. 3, pp.S112-S117 (Mar. 2005).
  87. Y. Seino, M. Abe, and S. Morita: “Atomically Resolved Imaging of Epitaxial CaF2 on Si(111) Using Noncontact Atomic Force Microscope”, in Scanning-Probe and Other Novel Microscopies of Local Phenomena in Nanostructured Materials, edited by S.V. Kalinin, B. Goldberg, L.M. Eng, and D. Huey (Mater. Res. Soc. Symp. Proc. 838E, Warrendale, PA , 2005), O1.9.
  88. S.Morita, I.Yi, Y.Sugimoto, N.Oyabu, O.Custance and M.Abe: “Mechanical Distinction and Manipulation of Atoms Based on Noncontact Atomic Force Microscopy”, Applied Surface Science, Vol. 241, No. 1-2, pp.2-8 (Feb. 2005).
  89. Y. Sugimoto, M. Abe, K. Yoshimoto, O. Custance, I. Yi, and S. Morita: “Non-contact atomic force microscopy study of the Sn/Si(111) mosaic phase”, Applied Surface Science, Vol. 241, No. 1-2, pp.23-27 (Feb. 2005).
  90. M. Abe and Y. Tanaka: “Measurement of magnetic field saturation and its site dependence of a recording head using the magnetic force microscope,”IEEE Transaction on Magnetics, Vol.40, No.3, pp.1708-1711 (May 2004).
  91. S. Morita, Y. Sugimoto, N. Oyabu, R. Nishi, O. Custance, Y. Sugawara, and M. Abe: “Atom selective imaging and mechanical atom manipulation using the noncontact atomic force microscope,” Journal of Electron Microscopy, Vol.53, No.2, pp.163-168 (2004).
  92. S. Morita, N. Oyabu, R. Nishi, K. Okamoto, M. Abe, O. Custance, Y. Seino, and Y. Sugawara: “Atom selective imaging and mechanical atom manipulation based on noncontact atomic force microscope method,” e-Journal of Surface Science and Nanotechnology Vol. 1, pp.158-170 (2003).
  93. M.Abe and Y. Tanaka: “A study of high-frequency characteristics of write heads with the AC-phase high-frequency magnetic force microscope”, IEEE Transaction on Magnetics, Vol. 38, No. 1, pp. 45-49 (2002).
  94. M. Abe and Y. Tanaka: “High frequency write head measurement with the phase detection magnetic force microscope”, Journal of Applied Physics, Vol. 89, No. 11,  pp.6766-6768 (2001).
  95. S. Morita, M. Abe, K. Yokoyama and Y. Sugawara: “Defects and their charge imaging on semiconductor surfaces by noncontact atomic force microscopy and spectroscopy”, Journal of Crystal Growth, Vol. 210, Nos. 1-3, pp. 408-415 (1999).
  96. Y. Sugawara, T. Uchihashi, M. Abe, and S. Morita: “True atomic resolution  imaging of surface structure and surface charge on the GaAs(110)”, Applied Surface Science, Vol. 140, Nos. 3-4, pp.371-375 (1999).
  97. M. Abe, Y. Sugawara, K. Sawada, Y. Andoh, and S. Morita: “Near-field optical imaging using force detection with tip-electrode geometry”, Applied Surface Science, Vol. 140, Nos. 3-4, pp.383-387 (1999).
  98. M. Abe, Y. Sugawara, K. Sawada, Y. Andoh, and S. Morita: “Optical near-field imaging using Kelvin probe technique”, Japanese Journal of Applied Physics, Vol. 37, No. 9A/B, L1074-L1077(1998).
  99. M. Abe, Y. Sugawara, Y. Hara, K. Sawada, and S. Morita: “Force imaging of optical near-field using noncontact mode atomic force microscopy”, Japanese Journal of Applied Physics, Vol.37, No. 2A, L167-L169 (1998).
  100. M. Abe, T. Uchihashi, M. Ohta, H. Ueyama, Y. Sugawara, and S. Morita : “Measurement of the evanescent field using noncontact mode atomic force microscope”, Optical Review Vol. 4, No. 1B, pp. 232-234 (1997).
  101. M. Abe, T. Uchihashi, M. Ohta, H. Ueyama, Y. Sugawara, and S. Morita : “Detection mechanism of optical evanescent field by using noncontact mode atomic force microscope with frequency modulation detection method”, Journal of Vaccum Science & Technology B Vol. 15, No. 4, pp.1512-1515 (1997).

 

査読付き論文（英語で発表していない日本語オリジナル）

  1. 阿部真之、田中陽一郎：“磁気力顕微鏡による磁気再生ヘッドの破壊過程観察”, 電子情報通信学会論文誌C , Vol. J87C, No.5, pp.480-486 (2004).
  2. 阿部真之、田中陽一郎: “磁気録顕微鏡による高周波ヘッド磁界測定の高分解能化”, 電子情報通信学会論文誌C, Vol. J85-C, No. 2, pp. 94-99 (2002). 

 

 

学会プロシーディングス等（査読なし）

  1. S. Jinno, S. Kitora, H. Toki, and M. Abe: "Study of Simultaneous Switching Noise in Two-dimensional Transport Theory including Radiation Effect", 2018 Progress In Electromagnetics Research Symposium (PIERS Toyama), pp.642-647.
  2. S. Kitora, S. Jinno, H. Toki, and M. Abe: "Coupling of Differential and Common Modes of Two-line Circuits in the Multi-conductor Transmission-line Theory Including Radiation", 2018 Progress In Electromagnetics Research Symposium (PIERS Toyama), pp.570-574.
  3. S. Iwasaki, A. Hirai, Y. Sugimoto, M. Abe, and S. Morita: “Imaging of the Si clusters on the Si(111)-(7x7) surface by using NC-AFM”, Proceedings of International Journal of Advanced Microscopy and Theoretical Calculations (AMTC Letters, ISSN 1882-9465) vol.1 pp.82-83, 29th-30th June 2008.
  4. D. Sawada, T. Namikawa, M. Hiragaki, Y. Sugimoto, M. Abe, and S. Morita: “NC-AFM study of phosphorous/Si(001)2x1 surface”, Proceedings of International Journal of Advanced Microscopy and Theoretical Calculations (AMTC Letters, ISSN 1882-9465) vol.1 pp.84-85, 29th-30th June 2008.
  5. Masayuki Abe, Yoshiaki Sugimoto, Kazutoshi Mizuta, Kenichi Morita, Óscar Custance, and Seizo Morita: “Site-specific force spectroscopy at room temperature using atom tracking technique,” Proceedings of Trend in Nanotechnology 2005 (TNT05), August 29 - September 2 (2005), Ovied, Spain(2 pages).
  6. Yoshiaki Sugimoto, Masayuki Abe, and Seizo Morita: “Highly resolved non-contact atomic force microscopy images of semiconductor surfaces,” Proceedings of Trend in Nanotechnology 2005 (TNT05), August 29 - September 2 (2005), Ovied, Spain(2 pages).
  7. Óscar Custance, Yoshiaki Sugimoto, Noriaki Oyabu, Masayuki Abe,  and Seizo Morita: “Lateral manipulation of single atoms using atomic force microscopy,” Proceedings of Trend in Nanotechnology 2005 (TNT05), August 29 - September 2 (2005), Ovied, Spain(2 pages).
  8. Noriaki Oyabu, Óscar Custance, Masayuki Abe, and Seizo Morita: “Measuring the forces during the mechanical vertical manipulation of single atoms at semiconductgor surfaces,” Proceedings of Trend in Nanotechnology 2005 (TNT05), August 29 - September 2 (2005), Ovied, Spain(2 pages).
  9. Oscar Custance, Noriaki Oyabu, Yoshiaki Sugimoto, Masayuki Abe, and Seizo Morita: “Noncontact atomic force microscopy study and selected single atom mechanical vertical manipulation experiments on the Ge(111)-c(2x8) surface,” Proceedings of 8th Asia-Pacific Conference on Electron Microscopy (8APEM), pp.206-207, June 7-11 (2004), Kanazawa, Japan.
  10. Yoshiaki Sugimoto, Masa Abe, Kentaro Yoshimoto, Oscar Custance, Insook Yi, Seizo Morita : “Atom selective imaging of Sn/Si(111) surface using noncontact atomic force microscope,” Proceedings of 8th Asia-Pacific Conference on Electron Microscopy (8APEM), pp.212-213, June 7-11 (2004), Kanazawa, Japan.
  11. M. Abe and Y. Tanaka : “A study of high frequency characteristics of write head with the magnetic force microscope”, Proceedings of The magnetic recording conference 2001, p.B3 (2 pages), 20th-22nd Aug. (2001), Minneapolis, USA.
  12. Y. Sugawara, M. Abe, K. Sawada, Y. Andoh and S. Morita : “Near-field optical imaging with force detection”, Proceedings of The 5th international conference on near field optics and related techniques, pp.16-17, 6th-10th Dec. (1998), Shirahama, Japan.
  13. S. Morita, Y. Sugawara, T. Uchihashi, H. Ueyama, M. Abe, and M. Suzuki: “Atomically-Resolved Imaging of n+-GaAs(110) Cleaved Surface with Noncontact Atomic Force/Electrostatic Force Microscope”, Proceedings of International Symposium on Atomic Level Characterizations for New Materials and Devices ’97, pp.193-198, 9th-14th July (1997), Hawaii, USA.

 

解説・総説

  1. 小野田穣、Ayhan YURTSEVER、阿部真之、杉本宜昭：“原子間力顕微鏡による二酸化チタン表面の研究”, 表面科学Vol. 38, No. 8, pp. 413-418 (2017).
  2. 阿部真之：“GO_UCSDプログラム”, 生産と技術, Vol.69, No.3, pp.107-109 (2017).
  3. 阿部真之、土岐博：“電磁ノイズ削減へ向けた挑戦”, 生産と技術, Vol.67, No.4, pp.48-53 (2015).
  4. 阿部真之、杉本宜昭、森田清三：“非接触原子間力顕微鏡と室温原子操作”, 精密工学会誌，vol.79, No.3, pp.200-204 (2013).
  5. 阿部真之、杉本宜昭、森田清三：“ナノスケール計測におけるロバストネス―走査型プローブ顕微鏡の新技術”, システム/制御/情報 vol.55, No.4, pp.141-146 (2011).
  6. 森田清三、杉本宜昭、阿部真之：“単原子ペンによるナノパターンニング”, 顕微鏡 vol.45, No.1, pp.51-54 (2010).
  7. 森田清三、杉本宜昭、阿部真之：“原子分解能を持つ非接触原子間力顕微鏡の開発研究”, 表面科学 vol.31, No.1, pp.19-24 (2010).
  8. 森田清三、杉本宜昭、阿部真之：“交換型垂直原子操作を用いたアトムペン方式の原子埋め込み文字の研究”, 表面科学 vol.30, No.8, pp.454-459 (2009).
  9. 阿部真之、杉本宜昭、森田清三：“原子の化学的識別と操作”, Electrochemistry ２００９年５月号 Vol.77, No.5, pp.396-401 (2009).
  10. 阿部真之、杉本宜昭、森田清三： “表面機能元素の直接観察”, まてりあ ２００９年６月号 Vol.48, No. 6, pp.294-298 (2009).
  11. 森田清三、杉本宜昭、阿部真之：“力学的原子操作による原子埋め込み文字の室温組立”, 機能材料 vol.29, No.5 pp.28-33(2009).
  12. 森田清三、杉本宜昭、大藪範昭、O. Custance、阿部真之“フォースカーブによる元素識別とフォース・マッピング”, 表面科学 vol.29, No.4, pp.214-220 (2008).
  13. 阿部真之、杉本宜昭、森田清三：“原子間力顕微鏡－超高分解能イメージングから原子操作，原子識別のツール－”, 未来材料 vol.8, No.2, pp.6-9 (2008).
  14. 阿部真之、杉本宜昭、森田清三：“原子の指紋－原子間力顕微鏡による元素識別－”, 現代化学 ２００７年１１月号,  pp.22-26 (2007).
  15. 阿部真之、杉本宜昭、森田清三：“原子分解能を有する原子間力顕微鏡法の新展開”, 日本物理学会誌 vol.62, No.11, pp.829-837 (2007).
  16. 森田清三、杉本宜昭、O. クスタンセ、阿部真之：“AFMによる原子操作と複素ナノ構造体組立”, 顕微鏡 vol.42, No.2, pp.100-105 (2007).
  17. 森田清三、杉本宜昭、大藪範昭、O. クスタンセ、阿部真之、P. ポウ、P. ジェリネク、 R. ペレッツ：“複素ナノ構造体を組み立てる　－原子間力顕微鏡で原子を識別・操作・組み立て－”, 真空 vol. 50, No.3, pp.181-183 (2007).
  18. 杉本 宜昭、阿部 真之、Oscar Custance、森田 清三 : “NC-AFMによるSi(111)-(7x7)表面でのSi adatomの室温水平原子操作”, 表面科学 Vol.27, No.9, pp.535-539 (2006).
  19. 森田清三、杉本宜昭、オスカル・クスタンセ、阿部真之：　“原子間力顕微鏡による原子の力学的識別・操作・組立”, 真空 vol.49, No.11, pp.635-641 (2006).
  20. 森田清三、杉本宜昭、オスカル・クスタンセ、阿部真之：“極微の力で固体表面の原子を観る”, 学術月報 vol.59, No.3, pp.158-162 (March 2006).
  21. 阿部真之、杉本宜昭、オスカル・クスタンセ、森田清三：“原子間力顕微鏡を用いた室温におけるsite-specificなフォーススペクトロスコピー”, 表面科学 vol.27, No.2, pp.90-94 (February 2006).
  22. 阿部真之、森田清三：“周波数検出方式原子間力顕微鏡の超高分解能化とフォーススペクトロスコピー”, 計測と制御 vol.45, No.2, pp.93-98 (February 2006).
  23. 阿部真之、杉本宜昭、オスカル・クスタンセ、森田清三：“原子レベルでの新機能材料探索・作成技術の開発”, ケミカルエンジニアリング, vol.51, No.1, pp.36-41 (January 2006).
  24. 杉本 宜昭、阿部 真之、Oscar Custance、森田 清三 : “非接触原子間力顕微鏡を用いた「交換型原子操作」”, 表面科学 vol.26, No.7, pp.415-420 (July 2005).
  25. 森田清三、杉本宜昭、大藪範昭、Oscar Custance、西竜治、清野宜秀、李仁淑、阿部真之： “原子間力顕微鏡によるSiとGe表面での原子操作”, 表面科学 vol. 26, No. 6, pp.351-356 (June 2005).
  26. 阿部真之、杉本宜昭、清野宜秀、森田清三：“非接触原子間力顕微鏡の超高分解能化と鉄シリサイド薄膜測定への応用”, 第７回シリサイド系半導体研究会予稿集, pp.11-14, JSAP Catalog Number:AP053209 (Mar 2005).
  27. 森田清三、大藪範昭、杉本宜昭、オスカル　クスタンセ、阿部真之：“原子間力顕微鏡による室温水平原子操作と組立”, 固体物理 vol.40, No.4, pp.273-280 (Aprl. 2005).
  28. 森田清三、Oscar Custance、大藪範昭、西竜治、李仁淑、清野宜秀、阿部真之：“原子押し込み－AFMによる原子の力学的垂直操作－”, 物性研究 vol.81, No.6, pp.900-903 (Mar. 2003).
  29. 森田清三、岡本憲二、内橋貴之、阿部真之、菅原康弘 : “原子間力顕微鏡を使った電荷の原子レベル観察” , 静電気学会誌 vol.27, No.2 pp.64-68(2003) .
  30. 菅原康弘、阿部真之、森田清三：“原子間力顕微鏡によるエバネセント波の検出”, 光学vol.26, No.10, pp.537-538 (1997).

 

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